NEC - 78K/0 Series

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Contents

User s Manual 78K 0 Series Instructions Common to 78K 0 Series Document No U12326EJ4V0UM00 4th edition Date Published October 2001 N CP K NEC Corporation 1995 Printed in Japan MEMO 2 User s Manual U12326EJ4V0UM NOTES FOR CMOS DEVICES PRECAUTION AGAINST ESD FOR SEMICONDUCTORS Note Strong electric field when exposed to a MOS device can cause destruction of the gate oxide and ultimately degrade the device operation Steps must be taken to stop generation of static electricity as much as possible and quickly dissipate it once when it has occurred Environmental control must be adequate When it is dry humidifier should be used It is recommended to avoid using insulators that easily build static electricity Semiconductor device ...